首页> 外文OA文献 >Electrical and pyroelectric properties of in-plane polarized lead lanthanum titanate thin film
【2h】

Electrical and pyroelectric properties of in-plane polarized lead lanthanum titanate thin film

机译:平面极化钛酸镧铅薄膜的电和热电性质

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Pb[sub 0.9]La[sub 0.1]Ti[sub 0.975]O₃ (PLT10) thin films were deposited on SiO₂ /Si(100) substrates coated with a ZrO₂ buffer layer. Studies by x-ray diffraction and scanning electron microscopy reveal that the ZrO₂ film consists of both tetragonal and monoclinic phases, with the tetragonal phase being the dominant one. The PLT10 film has a perovskite structure and the grains in the film have a rather uniform size of about 50 nm. By using interdigital transducer (IDT) electrodes the in-plane electrical properties, hysteresis loop, and pyroelectric coefficient of the PLT10 film were measured. The dielectric constant and loss factor vary only slightly with frequency in the range 10³-10[sup 6] Hz, with the loss factor being less than 0.01 over the entire range. The leakage current density is lower than 2x10[sup -8]A/cm² at a bias field of 5 kV/cm. The remnant polarization and coercive field are 12.6 µC/cm² and 9.93 kV/cm, respectively. The film exhibits a reasonably high pyroelectric coefficient (95 µC/m²K) after it has been poled by applying 120 V ac at 0.1 Hz across the IDT electrodes.
机译:将Pb [sub 0.9] La [sub 0.1] Ti [sub 0.975] O 3(PLT10)薄膜沉积在涂有ZrO 2缓冲层的SiO 2 / Si(100)衬底上。用X射线衍射和扫描电子显微镜研究表明,ZrO 2膜由四方相和单斜相组成,而四方相是主要相。 PLT10膜具有钙钛矿结构,膜中的晶粒具有约50 nm的相当均匀的尺寸。通过使用叉指式换能器(IDT)电极,测量了PLT10膜的面内电性能,磁滞回线和热电系数。介电常数和损耗因子随频率在10³-10[sup 6] Hz范围内的变化很小,在整个范围内损耗因子小于0.01。在5 kV / cm的偏置电场下,泄漏电流密度低于2x10 [sup -8] A /cm²。剩余极化和矫顽场分别为12.6 µC /cm²和9.93 kV / cm。通过在IDT电极两端施加0.1 Hz的120 V交流电极化后,该膜表现出相当高的热电系数(95 µC /m²K)。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号